■ InGaAs陣列探測(cè)器
■ 集成熱電制冷系統(tǒng)
■ 16位USB A/D轉(zhuǎn)換器
■ 交叉式Czerny-Turner光學(xué)平臺(tái)
■ 支持多種觸發(fā)模式
■ 提供多種光柵選擇
指標(biāo)參數(shù) |
NIRQuest512-XR |
NIRQuest512 |
NIRQuest512-1.9 |
波長(zhǎng)范圍: |
800-1600
nm w/Grating NIR3 |
900-1700
nm w/Grating NIR3 |
1100-1900
w/ Grating NIR3 |
波長(zhǎng)分辨率
(FWHM): |
~3.1
nm w/25 μm slit |
~3.1
nm w/25 μm slit |
~3.1
nm w/25 μm slit |
信噪比(滿量程時(shí)): |
>15000:1 @ 100 ms integration; >13000:1 @ 1000 ms
integration |
>15000:1 @ 100 ms integration; >13000:1 @ 1000 ms
integration |
>10000:1 @ 100 ms integration |
模數(shù)轉(zhuǎn)換分辨率 |
16-bit |
16-bit |
16-bit |
暗噪聲: |
6 RMS
counts @ 100 ms |
6 RMS
counts @ 100 ms |
6 RMS
counts @ 100 ms |
12 RMS
counts @ 1 s |
12 RMS
counts @ 1 s |
12 RMS
counts @ 250 ms | |
動(dòng)態(tài)范圍: |
|
|
|
積分時(shí)間: |
1 ms
-120 seconds |
1 ms
-120 seconds |
1 ms
-1 second |
噪聲等效功率: |
0.5pW |
0.5pW |
10.0pW |
指標(biāo)參數(shù) |
NIRQuest256-2.1 |
NIRQuest512-2.2 |
NIRQuest512-2.5 |
NIRQuest256-2.5 |
波長(zhǎng)范圍: |
900-2050 nm w/Grating NIR2 |
900-2200 nm w/Grating NIR2 |
900-2500 nm w/Grating NIR1 |
900-2500 nm w/Grating NIR1 |
波長(zhǎng)分辨率
(FWHM): |
~7.6
nm w/25 μm slit |
~5.0
nm w/25 μm slit |
~6.3
nm w/25 μm slit |
~ 9.5
nm w/25 μm slit |
信噪比(滿量程時(shí)): |
10000:1 @ 100 ms integration |
10000:1 @ 100 ms integration |
4000:1 @ 10 ms integration |
7500:1 @ 10 ms integration |
模數(shù)轉(zhuǎn)換分辨率 |
16-bit |
16-bit |
16-bit |
16-bit |
暗噪聲: |
6 RMS
counts @ 100 ms |
6 RMS
counts @ 100 ms |
16 RMS
counts @ 10 ms |
8 RMS
counts @ 10 ms |
12 RMS
counts @ 250 ms |
12 RMS
counts @ 250 ms |
24 RMS
counts @ 30 ms |
12 RMS
counts @ 30 ms | |
動(dòng)態(tài)范圍: |
|
|
100K (system); 4K:1 for a single acquisition |
500K (system); 7.5K:1 for a single acquisition |
積分時(shí)間: |
1 ms-2
s |
1 ms-1
s |
1 ms –
30 ms |
1
ms-60 ms |
噪聲等效功率: |
5.0pW |
10.0pW |
100.0pW |
25.0pW |
產(chǎn)品優(yōu)勢(shì):
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